Research Scientist II

Job description

Job Title: Research Scientist II
Location: Atlanta, Georgia
Regular/Temporary: Regular
Full/Part Time: Full-Time
Job ID: 225496
Location

Atlanta, GA

Department Information

The Materials Characterization Facility (MCF) is a joint venture of the Institute for Electronics and Nanotechnology (IEN) and the Institute for Materials (IMat), two interdisciplinary research institutes at the Georgia Institute of Technology. The MCF offers a wide variety of microscopy and characterization tools, as well as skilled research staff, to support the needs of academic, industry, and government users. It also provides a full set of services for researchers including equipment training, remote sample pre and analysis, and process and imaging consultations.

Job Summary

The MCF is seeking a Research Scientist II to aid with our new Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) system, and more broadly, to support the existing and possible new instruments in the MCF. The Research Scientist II will:

  • Coordinate activities involving the FIB/SEM and other MCF instruments (training, usage, analysis, demonstrations, etc)
  • Interact with various Principal Investigators - both internal (GT) and external academic and industrial - to learn/explain what projects of theirs might benefit from FIB/SEM analysis
  • Carry out FIB preparation of TEM lamellae and/or other sample preparation
  • Perform advanced imaging/analytical measurements

The position will interact with students, faculty, staff, vendors, and contractors. There will not be any direct reports to the researcher.

Required Qualifications
  • A Master’s degree in Materials Science/Engineering, Physics, or related discipline and three (3) years of relevant full-time experience after completion of that degree, or
  • A Master’s degree in Materials Science/Engineering, Physics, or related discipline and five (5) years of relevant full-time experience after completion of a Bachelor’s degree, or
  • A Doctoral degree in Materials Science/Engineering, Physics, or related discipline
Preferred Qualifications
  • FIB-specific expertise is strongly preferred
  • Significant experience with electron microscopy
  • Experience with a wide range of characterization techniques (XPS, AFM, BES, etc)
  • Experience working as part of a team in a multi-user environment or serving a larger community of users
  • Good written and verbal communication skills
Contact Information

For additional information about this job opening, please contact Brian McGlade, [email protected]

Equal Employment Opportunity

Georgia Tech provides equal opportunity to all faculty, staff, students, and all other members of the Georgia Tech community, including applicants for admission and/or employment, contractors, volunteers, and participants in institutional programs, activities, or services. Georgia Tech complies with all applicable laws and regulations governing equal opportunity in the workplace and in educational activities. Georgia Tech prohibits discrimination, including discriminatory harassment, on the basis of race, ethnicity, ancestry, color, religion, sex (including pregnancy), sexual orientation, gender identity, national origin, age, disability, genetics, or veteran status in its programs, activities, employment, and admissions. This prohibition applies to faculty, staff, students, and all other members of the Georgia Tech community, including affiliates, invitees, and guests.

 

 

 

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Job No:
Posted: 4/2/2021
Application Due: 7/1/2021
Work Type: Full Time
Salary: